How microscopic machines can fail in the blink of an eye
NIST researchers have developed a method for more quickly tracking microelectromechanical systems (MEMS) as they work and, just as importantly, as they stop working.
from Latest Science News -- ScienceDaily https://ift.tt/2Rw5H8E
from Latest Science News -- ScienceDaily https://ift.tt/2Rw5H8E
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